| Abstract: | A thin-film deposition system was developed for the surface coating of X-ray mirrors of up to 1 m in length. With two coating process areas and four sputtering cathodes, various combinations employing a single layer, multilayered, and co-sputtered thin films are possible. Furthermore, it is possible to correct and modify the mirror surface shape by controlling the speed of the substrate stage. In this study, to evaluate the performance of the proposed coating system, the static coating distribution was measured to check the vertical direction. In a 10 mm area, a 0.9% peak-to-valley error and 0.2% root mean square error occurred. A differential deposition test was also performed for the horizontal direction (stage scan direction). In this study, arbitrary shapes were deposited on 100-mm and 400-mm-long mirrors. After removing the measurement error, the deposition error was less than 1 nm (peak-to-valley). The results demonstrate that this system can correct the surface of an X-ray mirror with ultra-high precision. |
