Exact and approximate area-proportional circular Venn and Euler diagrams |
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Authors: | Wilkinson Leland |
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Affiliation: | Systat Software, Inc., 225 W Washington St., Suite 425, Chicago, IL 60606, USA. Leland.Wilkinson@systat.com |
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Abstract: | Scientists conducting microarray and other experiments use circular Venn and Euler diagrams to analyze and illustrate their results. As one solution to this problem, this paper introduces a statistical model for fitting area-proportional Venn and Euler diagrams to observed data. The statistical model outlined in this paper includes a statistical loss function and a minimization procedure that enables formal estimation of the Venn/Euler area-proportional model for the first time. A significance test of the null hypothesis is computed for the solution. Residuals from the model are available for inspection. As a result, this algorithm can be used for both exploration and inference on real data sets. A Java program implementing this algorithm is available under the Mozilla Public License. An R function venneuler() is available as a package in CRAN and a plugin is available in Cytoscape. |
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