| IC芯片管脚缺陷在线视觉检测系统研究 |
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| 引用本文： | 朱更明,李方敏. IC芯片管脚缺陷在线视觉检测系统研究[J]. 计算机工程与应用, 2002, 38(1): 232-235 |
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| 作者姓名： | 朱更明 李方敏 |
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| 作者单位： | 湘潭工学院计算机系,湘潭,411201 |
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| 基金项目： | 国家自然科学基金(编号:69974031)资助 |
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| 摘 要： | 利用图象顺序形态学以及基于知识的阈值选择算法对IC图象进行预处理,具有运算量小、速度快和有效的特点。检测过程采用Blob分析,引入质量控制图方法分析系统误差对系统稳定性的影响,计算了检测系统的工序能力。系统检测精度高,实时性好,满足在线检测的要求。
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| 关 键 词： | IC芯片缺陷 计算机视觉 顺序形态学 Blob分析 质量控制图 |
| 文章编号： | 1002-8331-(2002)01-0232-04 |
| 修稿时间： | 2001-09-01 |
Study of Defect Inspection for IC Based on Computer Vision |
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| Zhu Gengming Li Fangmin. Study of Defect Inspection for IC Based on Computer Vision[J]. Computer Engineering and Applications, 2002, 38(1): 232-235 |
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| Authors: | Zhu Gengming Li Fangmin |
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| Abstract: | That the Ranked-order Morphological and knowledge threshold selection are used for Image Manipulation has brought some advantages such as little operation,fast speed,and great efficiency.Blobs analysis is used.Quality Con-trol Chart is used to analyze error for system stability,and,procedure capacity is figured out.Precision and real time can be to online inspect. |
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| Keywords: | IC Defect Computer Vision Ranked-order Morphological Blobs Analysis Quality Control Chart |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
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