Some transport properties of palladium films |
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| Authors: | M. A. Angadi S. M. Shivaprasad |
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| Affiliation: | (1) Department of Physics, The University of the West Indies, St Augustine, Trinidad;(2) Department of Physics, Indian Institute of Technology, New Delhi, India;(3) Present address: Department of Physics, University of Sussex, BN1 9RH Falmer, Brighton, Sussex, UK |
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| Abstract: | The effect of deposition rate and substrate temperature on the electrical resistivity ( ), temperature coefficient of resistance (TCR) and thermolelectric power (TEP) of palladium films, in the thickness range 2 to 25 nm, is found to be marked. Higher rates of deposition and substrate temperatures are found to result in larger grains and hence changes in transport properties. The Fuchs-Sondheimer theory is used to explain the size effect in palladium films while the Mayadas-Shatzkes and Meyer relations are employed to study these effects on, TCR and TEP. |
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