首页 | 本学科首页   官方微博 | 高级检索  
     

基于ATML框架的开放式TPS设计及系统应用
引用本文:周金陵,胡建旺,周鹏,赵诚. 基于ATML框架的开放式TPS设计及系统应用[J]. 测控技术, 2012, 31(7): 1-5. DOI: 10.3969/j.issn.1000-8829.2012.07.001
作者姓名:周金陵  胡建旺  周鹏  赵诚
作者单位:1.军械工程学院光学与电子工程系,河北石家庄,050003;2.军械工程学院训练部,河北石家庄,050003
摘    要:目前大部分测试系统软件开放性的设计取决于数据库的开放程度,而一直以来测试数据库的框架体系以及所包含的内容缺乏可依托的标准,限制了测试程序集(TPS)的可复用性和可移植性,而且维护升级耗时耗力.结合近两年逐步完善的ATML标准框架的相关内容,分别从测试需求描述、测试通道描述、测试信息描述、测试结果描述等方面建立符合统一规范的“模式”(schema),将TPS的开放性设计转化为对测试信息描述文档建立的开放性设计.同时,根据对ATS使用的权限将TPS的开放优先级按3级划分,既保证了ATS软件的正常可靠运行,又方便了TPS的维护和升级.

关 键 词:ATML  TPS  开放性  测试描述

Open TPS Design and System Application on ATML Framework
ZHOU Jin-ling , HU Jian-wang , ZHOU Peng , ZHAO Cheng. Open TPS Design and System Application on ATML Framework[J]. Measurement & Control Technology, 2012, 31(7): 1-5. DOI: 10.3969/j.issn.1000-8829.2012.07.001
Authors:ZHOU Jin-ling    HU Jian-wang    ZHOU Peng    ZHAO Cheng
Affiliation:1 (1.Department of Optical and Electronic Engineering,Ordnance Engineering College,Shijiazhuang 050003,China; 2.Ministry of Education and Training,Ordnance Engineering College,Shijiazhuang 050003,China)
Abstract:The degree of design openness for ATS software still depends on its database,but the framework of test databases and their contents included are always lack of standards,which limits the reusability and the portability of the TPS and its maintenance and upgrade.Based on the relevant content of the ATML standard Framework,schemas about test requirements description,test channels description,test information description and test results description are presented in order to meet the unified standards.In this way,exoteric design of TPS is supposed to be transformed to the design of the test description instance documents.Meanwhile,the priority of the TPS openness is divided into 3 grades according to the limits of the user’ s authority,which can not only ensure the normal operation of the ATS software,but also be convenient for the maintenance and upgrade of the TPS.
Keywords:ATML  TPS  openness  test description
本文献已被 CNKI 万方数据 等数据库收录!
点击此处可从《测控技术》浏览原始摘要信息
点击此处可从《测控技术》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号