On the dependence of interfacial resistance on contact materials between cathode and interconnect in solid oxide fuel cells |
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| Authors: | Nan Huang Beibei Han Yudong Wang Yuanyuan Li Yu Su Wanbing Guan Xiaodong Zhou Maorong Chai Subhash C. Singhal |
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| Affiliation: | 1. School of Materials Science and Engineering, Shanghai University of Engineering Science, Shanghai, 201610, China;2. Ningbo Institute of Materials Technology & Engineering, Chinese Academy of Sciences, Ningbo, 315201, Zhejiang, China;3. Department of Chemical Engineering and Institute for Materials Research and Innovation, University of Louisiana at Lafayette, Lafayette, LA, 70503, USA;4. State Power Investment Corporation Hydrogen Energy, 102209, China |
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| Abstract: | The dependence of interfacial contact resistance (ICR) on contact materials between cathode and interconnect is systematically studied under both isothermal oxidation and thermal cycling conditions. Three kinds of cathode current-collecting layer (CCCL) are used, (La,Sr) (Co,Fe)O3 (LSCF), LSCF+10%Ag, and Ag, and tested in a SUS430/CCCL/SUS430 sandwich structure to simulate the actual operation of the solid oxide fuel cells (SOFCs). Experimental results show that the ICR of LSCF+10%Ag exhibits the smallest value, in comparison with the specimens with LSCF and Ag paste, as well as the sample without a CCCL. For LSCF+10%Ag contact, the ICR increases from 0.0069 mΩ cm2 to 3.74 mΩ cm2 under an isothermal condition for 150 h, then increases from 3.74 mΩ cm2 to 10.79 mΩ cm2 after 15 thermal cycles. This work provides information for the understanding of possible mechanisms of performance degradation of SOFCs. |
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| Keywords: | CCCL ICR Isothermal oxidation Thermal cycling SOFCs |
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