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Automatic optical flank wear measurement of microdrills using level set for cutting plane segmentation
Authors:Guifang Duan  Yen-Wei Chen  Takeshi Sukegawa
Affiliation:(1) Department of Computer Science, University of Bonn, Germany;(2) Department of Mathematics, University of California, Los Angeles;(3) Department of Computer Science, University of California, Los Angeles;
Abstract:We address the problem of automatic optical flank wear measurement for microdrill bits’ inspection. Cutting plane segmentation of microdrill bits is a fundamental step in the measurement. However, in the case of smeared microdrill bits, cutting planes cannot be segmented correctly by conventional methods. To exactly extract the cutting plane, a level set technique is proposed to segment it from a drill bit image; then we adopt a projection profile-based method for measuring the features of flank wear of microdrills. A new feature of flank wear, called “end wear length”, is also introduced for flank wear evaluation with three other existing features. Experimental results indicate that it is a robust and effective approach for automatic flank wear measurement of microdrills in printed circuit board (PCB) manufacturing.
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