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Temperature dependence of 1/f noise in polysilicon-emitter bipolar transistors
Authors:Enhai Zhao Celik-Butler   Z. Thiel   F. Dutta   R.
Affiliation:Electr. Eng. Dept., Southern Methodist Univ., Dallas, TX, USA;
Abstract:1/f noise was measured on polysilicon-emitter bipolar n-p-n and p-n-p transistors over a temperature range of 173K
Keywords:
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