Temperature dependence of 1/f noise in polysilicon-emitter bipolar transistors |
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Authors: | Enhai Zhao Celik-Butler Z. Thiel F. Dutta R. |
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Affiliation: | Electr. Eng. Dept., Southern Methodist Univ., Dallas, TX, USA; |
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Abstract: | 1/f noise was measured on polysilicon-emitter bipolar n-p-n and p-n-p transistors over a temperature range of 173K
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