In situ characterization of ceramic cold sintering by small-angle scattering |
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| Authors: | Andrew J. Allen Igor Levin Russell A. Maier Suzanne E. Witt Fan Zhang Ivan Kuzmenko |
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| Affiliation: | 1. Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, MD, USA;2. X-ray Science Division, Argonne National Laboratory, Argonne, IL, USA |
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| Abstract: | The first in situ characterization of the pore morphology evolution during the cold sintering process (CSP) is presented using small-angle X-ray scattering methods. For practical reasons, measurements have been made on a model system, KH2PO4 (KDP). The scattering signal revealed a striking behavior that could be modeled with nanoscale structural features associated with the dissolution and reprecipitation of KDP close to the grain/pore interface during CSP. The prospects for future more quantitative experiments under a range of temperature and pressure conditions, as well as for studies of more technologically important materials such as ZnO are considered. |
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| Keywords: | characterization cold sintering process X-ray methods |
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