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大视场红外光电经纬仪精度标定
引用本文:刘岩俊,闫海霞,王东鹤.大视场红外光电经纬仪精度标定[J].红外与激光工程,2015,44(3):832-836.
作者姓名:刘岩俊  闫海霞  王东鹤
作者单位:1.中国科学院长春光学精密机械与物理研究所,吉林长春130033;
基金项目:国家863高技术研究发展计划(2009AA8080603)
摘    要:为了提高大视场红外光电经纬仪测角精度,提出了一种多元回归分析的静态精度标定方法.对影响其精度的原因进行分析,并提出相应的解决办法.首先介绍了红外光电经纬仪的系统组成和测量原理,分析了物像空间在大地坐标系下的坐标对应关系,然后,指出了影响大视场红外光电经纬仪测量精度的原因是由于加工与装调过程中引起的误差,并且该误差与光学设计值不完全一致.最后,针对这一问题,提出了使用多元回归分析数据处理方法,该方法在全视场内按区域建立多元回归分析计算模型,当进行精度解算时,通过多元回归分析模型对脱靶量进行修正,使用修正后的脱靶量进行测角精度计算.实验结果表明:经过多元回归分析修正后的方位角与高低角测角误差差分别由21.44与26.81提高到7.62与6.38.有效地提高了大视场红外光电经纬仪的测角精度.

关 键 词:光电经纬仪    多元回归分析    测角精度    红外相机
收稿时间:2014-07-20

Calibration for wide field of view infrared theodolite
Liu Yanjun , Yan Haixia , Wang Donghe.Calibration for wide field of view infrared theodolite[J].Infrared and Laser Engineering,2015,44(3):832-836.
Authors:Liu Yanjun  Yan Haixia  Wang Donghe
Affiliation:1.Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences,Changchun 130033,China;2.College of Electronic Science and Engineering,Jilin University,Changchun 130021,China
Abstract:In order to improve the precision of wide field of view infrared optoelectronic theodolite, a calibration method based on multiple regression analysis was established, the reasons which effected the precision of wide field of view infrared optoelectronic theodolite were analyzed and the solution was proposed. First, the measurement theory and shipment of wide field of view infrared optoelectronic theodolit were introduced, the relationship between the object and the image in geodetic coordinates was analyzed. Then, the reason which effected the measurement of wide field of view infrared optoelectronic theodolite was the error between optical design, produce and machining, and the effect must be resolved after installation and adjustment. Lastly, a method based on multiple regression analysis was proposed, the calibration mode was established in all field of view by multiple regression analysis, after that, when measurement, the measurement data will be revised by the calibration multiple regression analysis mode. Experimental results indicate that the precision of the system in horizontal and vertical are improved from 21.44and 26.81to 7.62and 6.38. This method improves the measurement precision effectively.
Keywords:optoelectronic theodolite  multiple regression analysis  measurement precision  infrared camera
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