High resolution extreme ultraviolet spectrometer for an electron beam ion trap |
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Authors: | Ohashi Hayato Yatsurugi Junji Sakaue Hiroyuki A Nakamura Nobuyuki |
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Affiliation: | Institute for Laser Science, The University of Electro-Communications, Chofu, Tokyo, Japan. h_ohashi@ils.uec.ac.jp |
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Abstract: | An extreme ultraviolet spectrometer has been developed for spectroscopic studies of highly charged ions with an electron beam ion trap. It has a slit-less configuration with a spherical varied-line-spacing grating that provides a flat focal plane for grazing incidence light. Alternative use of two different gratings enables us to cover the wavelength range 1-25 nm. Test observations with the Tokyo electron beam ion trap demonstrate the high performance of the present spectrometer such as a resolving power of above 1000. |
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