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Tairus合成绿柱石的宝石学特征
引用本文:Gagan Choudhary,黄艺兰《宝石和宝石学杂志》编辑部. Tairus合成绿柱石的宝石学特征[J]. 宝石和宝石学杂志, 2009, 11(1)
作者姓名:Gagan Choudhary  黄艺兰《宝石和宝石学杂志》编辑部
作者单位:宝石检测实验室,斋浦尔,302003,印度
摘    要:以泰国曼谷Tairus有限公司生产的Tairus水热法合成绿柱石样品为研究对象,对其宝石学特征进行了测试与研究.结果显示,样品的常规宝石学特征(如RI,相对密度)与其天然绿柱石的相同;肉眼可见其锯齿状生长纹,可作为其合成绿柱石的特征.当这种合成绿柱石产品的内部特征不明显时,可采用FTIR和EDXRF分析技术对其进行诊断性鉴定.

关 键 词:合成绿柱石  宝石学特征

Gemmological Characteristics of Tairus Synthetic Beryl
Gagan Choudhary. Gemmological Characteristics of Tairus Synthetic Beryl[J]. Journal of Gems & Gemmology, 2009, 11(1)
Authors:Gagan Choudhary
Affiliation:Gem Testing Laboratory;Jaipur 302003;India
Abstract:The study represents the gemmological characteristics of "Tairus" hydrothermal beryls,which were procured by the Tairus Co.Ltd.The results show that the standard gemmological characteristics,such as RI and SG,overlap with those of the natural counterparts.Microscopic features,such as "chevron" growth could readily identify the materials as synthetic which is visible even with unaided eyes.However,there might be cases when the internal features may not identify the material that the FTIR and EDXRF analysis c...
Keywords:Tairus
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