Pb(Zn1/3Nb2/3)O3基复相陶瓷的显微结构发展与介电性能的关系

采用混合烧结法在PZN-BT-PT系统中制备了温度稳定PZN基复相陶瓷,借助SEM、TEM和介电温谱研究了复相陶瓷的显微结构发展与介电性能的关系,结果表明,复相陶瓷以溶解-沉淀机制进行晶粒生长,伴随该过程发生两相间固溶反应,使介电常数的温度稳定性降低.

The Relationship between Microstructural Development and Dielectic Properties of Pb(Zn1/3Nb2/3)O3-based Composite Ceramics

PZN-based composite ceramics were prepared in PZN-BT-PT system by mixed-sintering method.The dependence of dielectric properties on microstructural development for PZN composite ceramics sintered under various conditions were studied using SEM,TEM and the measurements of dielectric properties.The results revealed that the grains grow by solution-precipitation mechanism.During this process,the solid-solution reaction between two phases takes place by the formation of the growth layer on the initial particle.The amount of solid solution between two phases increases as sintering temperature increases and soaking time is prolonged.This leads to reduce the stability of dielectric properties on temperature for PZN composite ceramics.