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5. VCNR type characteristic in thin film amorphous TeGeAsSi films

Authors:	Zvi Yaniv Abraham Sanderichin

Affiliation:	Practical Engineering College, PO Box 45, Beer-Sheva, Israel

Abstract:	In the hope of further understanding the memory and switching effects of amorphous evaporated semi-conductor films, the current-voltage curve of the quarternary system TeGeAsSi was experimentally examined and our findings are discussed below.

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