Optical and dielectric properties of double helix DNA thin films

In this work, the thin film of wheat DNA was deposited by spin-coating technique onto glass substrate, and the optical and dielectric properties of the double helix DNA thin film were investigated. The optical constants such as refractive index, extinction coefficient, dielectric constant, dissipation factor, relaxation time, and optical conductivity were determined from the measured transmittance spectra in the wavelength range 190–1100 nm. Meanwhile, the dispersion behavior of the refractive index was studied in terms of the single oscillator Wemple–DiDomenico (W–D) model, and the physical parameters of the average oscillator strength, average oscillator wavelength, average oscillator energy, the refractive index dispersion parameter and the dispersion energy were achieved. Furthermore, the optical band gap values were calculated by W–D model and Tauc model, respectively, and the values obtained from W–D model are in agreement with those determined from the Tauc model. The analysis of the optical absorption data indicates that the optical band gap E_g was indirect transitions. These results provide some useful references for the potential application of the DNA thin films in fiber optic, solar cell and optoelectronic devices.