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New Exponentially Weighted Moving Average Control Charts for Monitoring Process Mean and Process Dispersion
Authors:Abdul Haq  Jennifer Brown  Elena Moltchanova
Affiliation:Department of Mathematics and Statistics, University of Canterbury, Christchurch, New Zealand
Abstract:Exponentially weighted moving average (EWMA) control charts have been widely accepted because of their excellent performance in detecting small to moderate shifts in the process parameters. In this paper, we propose new EWMA control charts for monitoring the process mean and the process dispersion. These EWMA control charts are based on the best linear unbiased estimators obtained under ordered double ranked set sampling (ODRSS) and ordered imperfect double ranked set sampling (OIDRSS) schemes, named EWMA‐ODRSS and EWMA‐OIDRSS charts, respectively. We use Monte Carlo simulations to estimate the average run length, median run length, and standard deviation of run length of the proposed EWMA charts. We compare the performances of the proposed EWMA charts with the existing EWMA charts when detecting shifts in the process mean and in the process variability. It turns out that the EWMA‐ODRSS mean chart performs uniformly better than the classical EWMA, fast initial response‐based EWMA, Shewhart‐EWMA, and hybrid EWMA mean charts. The EWMA‐ODRSS mean chart also outperforms the Shewhart‐EWMA mean charts based on ranked set sampling (RSS) and median RSS schemes and the EWMA mean chart based on ordered RSS scheme. Moreover, the graphical comparisons of the EWMA dispersion charts reveal that the proposed EWMA‐ODRSS and EWMA‐OIDRSS charts are more sensitive than their counterparts. We also provide illuminating examples to illustrate the implementation of the proposed EWMA mean and dispersion charts. Copyright © 2014 John Wiley & Sons, Ltd.
Keywords:average run length  control chart  exponentially weighted moving average  Monte Carlo simulation  ordered double ranked set sampling  statistical process control
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