Self-Diffusion of Er and Hf in Polycrystalline Er2O3-Stabilized HfO2 |
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Authors: | R. J. TESCH ,C.D. WIRKUS&dagger ,M.F. BERARD |
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Affiliation: | Ames Laboratory and Department of Materials Science and Engineering, Iowa State University, Ames, Iowa 50011 |
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Abstract: | Tracer self-diffusion coefficients for Er and Hf were measured in polycrystalline Er2O3-stabilized HfO2 (fluorite phase) at compositions between 10 and 40 mol% Er2O3 and temperatures between 1700° and 2033°C. In some instances, grain-boundary coefficients were also determined. The Hf volume coefficients were generally slightly smaller than Er coefficients, but neither showed a strong composition dependence, a finding most likely attributable to extensive clustering of charged defects which apparently rendered a large proportion of the "notional" defects essentially immobile. The activation energies for volume coefficients were very large, ranging from 630 to 760 kJ-mol−1, and generally decreased with increasing Er2O3 content. |
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