Novel microwave reflectometer for accurate characterisation of high-speed photodiode optoelectronic response

A reflectometer technique which corrects source-mismatch errors using scalar optoelectronic measurements alone is demonstrated. Results corrected using voltage-reflection-coefficient (VRC) measurements of both the photodiode and measurement system are compared with those determined by the new technique for a GaInAs photodiode measured to 40 GHz by a 1.5 mu m DFB laser heterodyne system. The optoelectronic response determined by the new technique falls within the scatter of the VRC corrected measurements.<>