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Design and comparison of some Shewhart‐type schemes for simultaneous monitoring of Weibull parameters
Authors:Min Gong  Amitava Mukherjee
Abstract:Weibull distribution is one of the most important probability models used in modeling time between events, system reliability, and particle sizes, among others. Therefore, efficiently and consequently monitoring certain changes in Weibull process is considered as an important research topic. Various statistical process monitoring schemes have been developed for monitoring different process parameters, including some for Weibull parameters. Most of these schemes are, however, designed to monitor and control a single process parameter, although there are two important model parameters for Weibull distribution. Recently, several researchers studied various schemes for jointly monitoring the mean and variance of a normally distributed process using a single plotting statistic. Nevertheless, there is still dearth of researches in joint monitoring of non‐normal process parameters. In this context, we develop some control schemes for simultaneously monitoring the scale and shape parameters of processes that follow the Weibull distribution. Implementation procedures are developed, and performance properties of various proposed schemes are investigated. We also offer an illustrative example along with a summary and recommendations.
Keywords:average run length (ARL)  in‐control (IC)  joint monitoring  likelihood ratio  maximum likelihood  out‐of‐control (OOC)  process control  profile monitoring  two‐parameter Weibull
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