测试系统继电器电阻值异常的工程学分析及解决

介绍了对于测试系统接触测试项目出现异常所做的分析,最终定位问题出现在测试系统继电器的电阻值的异常,经过分析和试验,其异常的原因归结为测试系统针对特定结构的被测产品因为考虑不周而使悬空的测试线路带有超过允许范围的电荷,导致在之后的继电器开关过程中对触点造成伤害.文中提出了解决方案并通过实践验证解决方案的可行性.

Analysis and Solution to the Abnormal Relay Resistance in Electronic Device Test System

This paper introduces an analysis to the abnormal behavior of the contact test performed by the test system. Finally, the problem is located in the abnormal resistance of the relay that connects the device under test to the tester. After analysis and test, the reason is the charge accumulated on the line when test some devices with special structure. If the charge is over the limit of relay, it will hurt the contact of the relay during switching. Thus a solution is provided as well as the verification.