Tutorial on x-ray microLaue diffraction |
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Authors: | Gene E. Ice Judy W.L. Pang |
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Affiliation: | Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6118, USA |
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Abstract: | MicroLaue diffraction combines the oldest x-ray diffraction method–Laue diffraction–with the most modern x-ray sources, optics and detectors. The combination can resolve complex materials into single-crystal-like submicron volumes. This unique ability to nondestructively map crystal structure at and below a sample surface, with high spatial and strain resolution can address long-standing fundamental issues in materials science. For example, the three-dimensional evolution of mesoscale structure and the self organization of defects can be observed nondestructively to understand the origins of inhomogeneous grain growth, deformation and fracture. |
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