正入射反射式太赫兹光谱测量的不确定度分析

太赫兹时域光谱技术能够快速、宽频带测量物质在太赫兹频段的光学或介电常数, 是物质识别的重要技术.光学常数的测量准确度完全受到复杂的测量过程和数据处理所影响.针对正入射反射式THz光谱测量, 分析了在测量材料介电特性过程中的误差来源, 它们包括太赫兹幅值误差、位置误差以及样品倾斜误差.建立了单独表征每个误差来源对于光学常数影响的不确定度分量的公式.利用MATLAB仿真了每个误差来源对于光学参数不确定度的影响.

Uncertainty in normal reflection terahertz spectroscopy measurement

Terahertz time-domain spectroscopy (THz-TDS) is a significant technique for characterizing materials as it allows fast and broadband measurement of optical constants in the THz regime. The measurement precision of the constants is highly influenced by the complicated measurement procedure and data processing. With particular emphasis on normal reflection measurement, the sources of error including amplitude errors and positioning error and sample misalignment in determining the dielectric properties of materials were analyzed. The uncertainty that characterizes the influence on the optical constants for each source was formulated independently. Several simulations were carried out to illustrate the relations between the error sources and the uncertainty of the optical constants.