Contrast and resolution enhancement of a near-field optical microscope by using a modulation technique |
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Authors: | Flaxer Eli Palachi Eldad |
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Affiliation: | School of Chemistry, The Sackler Faculty of Exact Sciences, Tel-Aviv University, Ramat Aviv, 69978 Tel-Aviv, Israel. flaxer@post.tau.ac.il |
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Abstract: | A new design of a tunneling near-field optical microscope (TNOM) combined with an atomic force microscope (AFM) is presented. This design can be used to generate three different images of the sample's surface: a non-contact (tapping mode) AFM image, a conventional TNOM and an image of a modulation signal of the conventional TNOM, which we call AC-TNOM. The images are obtained simultaneously, using a single light source. It is shown that the AC-TNOM has better resolution ( approximately 200A) and contrast compared to conventional TNOM ( approximately 400A). |
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