Isothermal physical aging of thin PMMA films near the glass transition temperature

Isothermal physical aging and the glass transition temperature (T _g) of PMMA thin films were investigated by means of differential scanning calorimetry (DSC). Freestanding thin films of different molecular weights (M _w = 120,000, 350,000, 996,000 g/mol) and film thicknesses (40–667 nm) were obtained by spin coating onto a silicon wafer substrate and then releasing the coated film using a water floating technique. The thin films were stacked in a DSC pan and isothermally aged for different aging times (t _a = 1 and 12 h) and aging temperatures (T _a = 105, 110, and 115 °C) below but near T _g. Enthalpy relaxation (ΔH _Relax), resulting from the isothermal physical aging, initially increased with increasing ΔT (T _g − T _a, driving force of aging), reached a maximum value, and then decreased with further increase in ΔT. Below ~100 nm film thickness, ΔH _Relax of samples aged near their T _g (i.e., T _a = 110 and 115 °C) decreased with decreasing film thickness, indicating the suppression of physical aging. Up to 9.9 °C depression in T _g was observed for thinner films (~40 nm), when compared to the thicker films (~660 nm) in this study. The decrease in ΔH _Relax with decreasing film thickness at a given T _a appears to be associated with the reduction in T _g.