Transistor frequency meter for measuring the thickness and growth rate of films

Conclusions Investigations carried out have shown the feasibility of constructing transistorized frequency-voltage converters with a high output voltage and a high linearity. The use of a similar circuit in the KIT-1 and KIT-2 instruments permit not only the thickness to be measured but also the rate of growth of a film in the case of deposition rates from O.1Å/sec and higher.Translated from Izmeritel'naya Tekhnika, No. 5, pp. 63–64, May, 1973.