Structural, dielectric and ferroelectric properties of multilayer lithium tantalate thin films prepared by sol-gel technique |
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Authors: | S. Satapathy Prabha VermaP.K. Gupta Chandrachur MukherjeeV.G. Sathe K.B.R. Varma |
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Affiliation: | a Laser Materials Development & Devices Division, Raja Ramanna Centre for Advanced Technology, Indore 452013, Indiab Laser Systems Engineering Division, Raja Ramanna Centre for Advanced Technology, Indore 452013, Indiac UGC-DAE Consortium for Scientific Research, Indore 452017, Indiad Materials Research Centre, Indian Institute of Science, Bangalore 560 012, India |
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Abstract: | Multilayer lithium tantalate thin films were deposited on Pt-Si [Si(111)/SiO2/TiO2/Pt(111)] substrates by sol-gel process. The films were annealed at different annealing temperatures (300, 450 and 650 °C) for 15 min. The films are polycrystalline at 650 °C and at other annealing conditions below 650 °C the films are in amorphous state. The films were characterized using X-ray diffraction, atomic force microscopy (AFM) and Raman spectroscopy. The AFM of images show the formation of nanograins of uniform size (50 nm) at 650 °C. These polycrystalline films exhibit spontaneous polarization of 1.5 μC/cm2 at an application of 100 kV/cm. The dielectric constant of multilayer film is very small (6.4 at 10 kHz) as compared to that of single crystal. |
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Keywords: | Sol-gel process Lithium tantalate Atomic force microscopy Hysteresis Dielectric properties Raman spectroscopy X-ray diffraction |
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