Characterization of β-Silicon Nitride Whiskers |
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| Authors: | Joseph Homeny Lynn J. Neergaard Keith R. Karasek Jeffry T. Donner Steven A. Bradley |
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| Affiliation: | Department of Materials Science and Engineering, Ceramics Division, University of Illinois, Urbana, Illinois 61801;Allied-Signal EMRC, Des Plaines, Illinois 60017 |
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| Abstract: | The physical, chemical, and structural properties of a commercially available β-Si3N4 whisker were characterized. Bulk chemical analysis indicated that the whiskers were close to stoichiometric silicon nitride, with oxygen and yttrium as the major impurities. Surface chemistry analysis by XPS analysis revealed that the surfaces consisted primarily of silicon nitride, with the oxygen and yttrium impurities concentrated at the surfaces. SEM and STEM studies indicated that the whiskers were dimensionally straight with relatively featureless surfaces, although some whiskers had Y-rich particles attached. The whiskers were also found to be of extreme crystallographic perfection, as determined by TEM analysis. |
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| Keywords: | physical properties chemical properties structure silicon nitride whiskers |
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