A novel Z-axis diffractometer for X-ray diffraction and fluorescence studies |
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| Affiliation: | 1. Departamento de Biociencias e Ingeniería, Centro Interdisciplinario de Investigaciones y Estudios sobre Medio Ambiente y Desarrollo (CIIEMAD), Instituto Politécnico Nacional, C.P. 07340, Ciudad de México, Mexico;2. CONACyT-CIATEC A.C Centro de Innovacion Aplicada en Tecnologias Competitivas, Omega 201, Industrial Delta, 37545 León, Gto. Mexico;3. Universidad A. Metropolitana-Iztapalapa, División de Ciencias Básicas e Ingeniería, Av. San Rafael Atlixco 186, Col. Vicentina, 09340, Ciudad de México, Mexico;4. Instituto de Catálisis y Petroleoquímica, CSIC, Cantoblanco, E-28049, Madrid, Spain;5. Université de Caen Normandie, ENSICAEN, UNICAEN, CNRS, LCS, 14000, Caen, France;1. Chemical Engineering Department, Universidad de los Andes, Carrera 1 Este No 19A-40, Edificio Mario Laserna, Bogotá, Colombia;2. Chemistry Department, Universidad de los Andes, Carrera 1 No 18A-12, Bloque Q, Bogotá, Colombia;1. Department of Mechanical Engineering, University of Mohaghegh Ardabili, Ardabil, Iran;2. Department of Mining and Metallurgy Engineering, Amirkabir University of Technology, Tehran, Iran;3. Young Researchers and Elite Club, Miyaneh Branch, Islamic Azad University, Miyaneh, Iran;4. Faculty of Materials Engineering and New Technologies, Shahid Rajaee Teacher Training University, Tehran 16785-136, Iran;5. Department of Materials Science and Engineering, Research Institute of Advanced Materials, Seoul National University, Seoul 08826, Republic of Korea;1. School of Electrical & Electronic Engineering, The University of Adelaide, SA 5005, Australia;2. Department of Electrical & Electronic Engineering, Islamic University of Technology, Gazipur 1704, Bangladesh;1. College of Chemistry, Liaoning University, Shenyang 110036, PR China;2. College of Environment, Liaoning University, Shenyang 110036, PR China |
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| Abstract: | Recently several X-ray techniques have been demonstrated to have high potential for providing needed structural information to understand the many physical and chemical phenomena that occur at surfaces and interfaces. In this article we will describe an instrument that facilitates the performing of these types of measurements and allows for the investigation of the gas-liquid interface using a variety of synchrotron X-ray scattering techniques. This instrument employs the z-axis diffraction geometry in which the detector has two degrees of freedom while the sample (the gas-liquid interface) has only one degree of freedom — rotation around the vertical axis. A distinctive feature of this diffractometer is that it leaves a fixed illuminated footprint on the liquid interface and allows for an accurate determination of the relative scattering or fluorescence intensity at very shallow angles. The unique capabilities of this novel instrument have been demonstrated at synchrotron facilities in a variety of X-ray techniques: grazing incidence diffraction (GID), shallow angle reflection (SAR), near total external fluorescence (NTEF) and EXAFS experiments from the surface of liquids |
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