Effect of gas mixing ratio on gas-phase composition and etch rate in an inductively coupled CF4/Ar plasma |
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Authors: | AM Efremov |
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Affiliation: | School of Electrical and Electronic Engineering, Chung-Ang University, 221, Huksuk-Dong, Dongjak-Gu, Seoul 156-756, South Korea |
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Abstract: | In this work, we carried out investigations aimed at understanding the effect of gas mixing ratio on plasma parameters, gas phase composition and etch rate in CF4/Ar inductively coupled plasma. For this purpose, a combination of experimental methods and modelling was used. Experiments showed that electron temperature and electron density are not very sensitive to variations of Ar content in CF4/Ar plasma. From a zero-dimensional plasma model, the densities of both neutral and charged particles change monotonically. The analysis of surface kinetics based on an ion-assisted etching mechanism showed the possibility of non-monotonic etch rate behaviour due to a concurrence of chemical and physical etching pathways. |
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Keywords: | Plasma Dissociation Ionization Etch rate |
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