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Round pinholes in indium-tin-oxide thin films on the glass substrates: a Taguchi method analysis and theoretical approach to their origins
Authors:Ho-Chul Lee  O Ok Park
Affiliation:
  • a Mobile Part, Coating Laboratory, Gumi Research Center, Samsung Corning Co. Ltd., 644 Jinpyeong-dong, Gumi-si, Gyeongsangbuk-do 730-725, South Korea
  • b Department of Chemical and Biomolecular Engineering, Korea Advanced Institute of Science and Technology, 373-1 Guseong-dong, Yuseong-gu, Daejeon 305-701, South Korea
  • Abstract:The origin of the round pinholes, ranging 30-70 μm in diameter, in indium-tin-oxide (ITO) thin films on the glass substrates were investigated. It has been found that the round pinholes in ITO thin films might arise from the tiny particles and organics, adsorbed onto the residual water of imperfectly pre-dried glass substrates at the pre-drying bath. The tiny particles and organics on the glass substrates might cause to weaken the adhesive powers between the ITO thin films and the glass substrates, finally resulting in the round pinholes at the photopatterning process.By Taguchi methods, it was revealed that the generation of the round pinholes in ITO thin films was directly related to the temperature and the amount of heat supply at the pre-drying bath. A simplified mechanism on the formation of the round pinholes in ITO thin films is proposed and verified.
    Keywords:Indium tin oxide (ITO)   Pinholes   Ultrasonic cleaner   Cleaning   Glass substrate   Sputtering   Defects
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