E-pulse diagnostics of simple layered materials |
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| Authors: | Stenholm G.J. Rothwell E.J. Nyquist D.P. Kempel L.C. Frasch L.L. |
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| Affiliation: | Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA; |
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| Abstract: | The feasibility of using the E-pulse technique to diagnose changes in the properties of simple layered materials is undertaken. Numerical results for a conductor-backed lossy slab and a Salisbury screen show that changes in permittivity, conductivity and thickness can be diagnosed in the presence of white Gaussian noise. |
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