Voltage-Testing of Thin-film Capacitors |
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| Authors: | Berlicki T.M. |
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| Affiliation: | Institute of Electron Technology; Technical University; ul Z. Janiszewskiego 11/17; 50-372 Wroclaw, POLAND.; |
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| Abstract: | The influence of proof-test voltage and testing time on the working-life distribution of thin film capacitors is presented. The proof-test not only eliminates capacitors with low breakdown voltage, it decreases the working life of the remaining components. A short proof-test is proposed to avoid degrading the remaining components. The test method for estimating the distribution parameters is presented. |
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