首页 | 本学科首页   官方微博 | 高级检索  
     


Atom probe crystallography: Atomic-scale 3-D orientation mapping
Authors:Vicente J. Araullo-Peters  Baptiste Gault  Sachin L. Shrestha  Lan Yao  Michael P. Moody  Simon P. Ringer  Julie M. Cairney
Affiliation:1. Department of Materials Science and Engineering, The Ohio State University, Columbus, OH 43210, USA;2. Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109, USA;1. Department of Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Franz-Josef-Strasse 18, A-8700 Leoben, Austria;2. Thin Film Physics Division, Department of Physics, Chemistry and Biology (IFM), Linköping University, S-581 83 Linköping, Sweden;3. Materials Center Leoben Forschung GmbH, Roseggerstrasse 12, A-8700 Leoben, Austria;4. Department of Materials Physics, Montanuniversität Leoben and Erich Schmid Institute for Materials Science, Austrian Academy of Sciences, A-8700 Leoben, Austria
Abstract:
Keywords:
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号