| 发射装置发控系统的测试性设计与实践 |
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| 引用本文： | 赵月琴.发射装置发控系统的测试性设计与实践[J].航空兵器,2007(5):26-29. |
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| 作者姓名： | 赵月琴 |
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| 作者单位： | 中国空空导弹研究院,河南,洛阳,471009 |
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| 摘 要： | 测试性和B IT设计是提高装备可靠性与维修性的重要技术手段。本文分析了发射装置维修和测试方案,叙述了发射装置发控系统的测试性设计技术,特别是提出了按整机、组件、电路板三级结构层次配置测试点的方案。
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| 关 键 词： | 发射装置 测试性 BIT |
| 文章编号： | 1673-5048（2007）05-0026-04 |
| 修稿时间： | 2006-05-15 |
Testability Design and Practice on Launcher Control System |
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| ZHAO Yue-qin.Testability Design and Practice on Launcher Control System[J].Aero Weaponry,2007(5):26-29. |
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| Authors: | ZHAO Yue-qin |
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| Affiliation: | China Airborne Missile Academy, Luoyang 471009, China |
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| Abstract: | Testability and BIT technique is an important approach to improve reliability and maintainability of weapons.In this paper,on the basis of analyzing the scheme of launcher test and maintenance,the design technique of testability on launcher control system is presented.Especially,the test point layout based on the three levels: the whole product,assembly and circuit board is presented. |
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| Keywords: | launcher testability BIT |
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