Capacitor-less A-RAM SOI memory: Principles, scaling and expected performance |
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Authors: | Noel Rodriguez Sorin Cristoloveanu Francisco Gamiz |
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Affiliation: | a Dept. Electronics, Facultad de Ciencias, Universidad de Granada, 18071 Granada, Spain;b IMEP-MINATEC, BP 257 F38016 Grenoble Cedex 1, France |
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Abstract: | Based on numerical TCAD simulations, the novel capacitor-less A-RAM memory cell is detailed in terms of electrostatic effects, transient operation and retention time. The particular double-body device architecture on SOI is beneficial for better scalability than conventional 1T-DRAMs. Its dual body partitioning suppresses the supercoupling effect in SOI; the two types of carriers can coexist inside ultrathin fully depleted transistors. Electrons and holes are accommodated in different bodies, separated by an insulator layer, but remain electrostatically coupled. A-RAM features easy discrimination of ‘0’ and ‘1’ states, simple control waveforms and very promising performance. |
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Keywords: | Capacitorless Floating-body SOI 1T-DRAM A-RAM Simulation MOSFET |
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