| 红外小光点扫描测试系统 |
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| 引用本文： | 张志勇 项道才. 红外小光点扫描测试系统[J]. 红外技术, 1997, 19(5): 21-23 |
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| 作者姓名： | 张志勇 项道才 |
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| 作者单位： | 青岛国防光电子计量一级站!青岛，266555 |
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| 摘 要： | 介绍了中波和长波“红外小光点扫描测试系统”。该系统由红外聚焦光学子系统，六维精密扫描工件台及数据采集子系统构成。可用于红外焦平面器件重要性能参数如串音、响应均匀性、转移效率的测量，也可用于单元红外探测器有效响应面积和响应均匀性等参数的测量。
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| 关 键 词： | 红外小光点 焦平面器件 测试 红外探测器 |
A Scanning Testing System of IR Micron-Spot |
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| Zhang Zhiyong, Xiang Daocai, Zhu Jinglong, Wang Ruoxu, Huang Chongkai, Cheng Kunfeng. A Scanning Testing System of IR Micron-Spot[J]. Infrared Technology, 1997, 19(5): 21-23 |
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| Authors: | Zhang Zhiyong Xiang Daocai Zhu Jinglong Wang Ruoxu Huang Chongkai Cheng Kunfeng |
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| Abstract: | The scanning testing system of IR micron-spot about MWIR and LWIR is described. Thesystem is composed of a IR focusing Subsystem, a precision scanning six dimensions stage anda data acquisition module.The crosstalk, uniformity and transfer efficiency of FPA can be measured. The effective area and unformity of IR detector can also be tested. |
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| Keywords: | IR micron-spot FPA Testing Crosstalking Unformity Effective area |
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