| 碲镉汞光导探测器的变温测试 |
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| 引用本文： | 程开芳 苏培超. 碲镉汞光导探测器的变温测试[J]. 红外技术, 1997, 19(4): 27-30,12 |
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| 作者姓名： | 程开芳 苏培超 |
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| 作者单位： | 昆明物理研究所 |
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| 摘 要： | 报道了ＨｇＣｄＴｅ光导探测器光电参数随温度变化的关系，重点描述了光谱响应变温测试，给出了ＨｇＣｄＴｅ器件从液氮到室温 之若干个不同温度点测试的光谱响应曲线及器件变温测试的性能参数对照表，并与经验公式计算结果进行对比，给出了相应的测试误差分析。
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| 关 键 词： | 红外探测器 变温测试 碲镉汞 |
Measurement of PC MCT Detector with Changing Temperatures |
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| Cheng Kaifang,Su Peichao. Measurement of PC MCT Detector with Changing Temperatures[J]. Infrared Technology, 1997, 19(4): 27-30,12 |
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| Authors: | Cheng Kaifang Su Peichao |
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| Abstract: | The relation between optoelectronic parameter and temperature of PC MCT Detectors,with an emphasis on spectral response changing with temperature,is described.The spectral responses and performances of these devices at several temperatures(from liquid nitrogen temperature to room temperature) are presented.Compared with results of empirical fomula,measurement error analysis is presented. |
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| Keywords: | HgCdTe detector Temperature changing measurement Spectral response |
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