纺织纤维表面的X光电子能谱研究袁骏

由于纤维聚集体不同于紧密结构材料，在用XPS测定分析纤维表面结构时，电子被电离射出的量要小得多，测定的灵敏度较低。通常纤维的聚集结构越紧密，对测定分析结果越有利，机织物是较好的测试材料形式。在对纤维表面元素含量测定时，低含量成分有变小的趋势，而高含量成分有变大的趋势。在测定分析纤维表面元素含量时，这种影响趋势对测定低含量成分可能会有较大的影响。，During the determining and analyzing the surface structure of the fiber by XPS, it is much different compared with the compact materials. For the less ionized electron emitted, the determining sensitivity is relatively lower. In general, the compact gathering way of fiber will do advantage of the determination, i.e. the woven fabric is the better sample way. The result analysis shows that the small amount element will be determined lower than its real amount, while the majority element will be determined much higher. This trend ought to be taken into account when analyzing the small amount element.

An Analysis on the Surface Structure Determination of Fiber by XPS

During the determining and analyzing the surface structure of the fiber by XPS, it is much different compared with the compact materials. For the less ionized electron emitted, the determining sensitivity is relatively lower. In general, the compact gathering way of fiber will do advantage of the determination, i.e. the woven fabric is the better sample way. The result analysis shows that the small amount element will be determined lower than its real amount, while the majority element will be determined much higher. This trend ought to be taken into account when analyzing the small amount element.