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Implementation of Band Gap and Gate Oxide Engineering to Improve the Electrical Performance of SiGe/InAs Charged Plasma-Based Junctionless-TFET
Authors:Kumar  Kaushal  Kumar  Ajay  Mishra  Varun  Sharma  Subhash Chandra
Affiliation:1.Microelectronics and VLSI Lab, Electronics and Computer Discipline DPT, IIT Roorkee, Roorkee, Uttarakhand, India
;2.Jaypee Institute of Information Technology, Noida, Uttar Pradesh, India
;3.Graphic Era Deemed to be University, Dehradun, Uttarakhand, India
;
Abstract:Silicon - This paper reports on a charged plasma-based adjustable bandgap source/channel (So/Ch) interface using a new semiconductor compound (SiGe/ InAs) and bimaterial oxide (HfO2/SiO2)...
Keywords:
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