A new photon source for ultraviolet photoelectron spectroscopy of organic and other damage-prone materials |
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| Affiliation: | 1. Department of Chemistry, University of Kentucky, 505 Rose St., Lexington, KY, 40506-0055, United States;2. Excitech GmbH, Branterei 33, 26419, Schortens, Germany;1. Physical Chemistry and Polymer Science (FYSC), Vrije Universiteit Brussel (VUB), Pleinlaan 2, B-1050, Brussels, Belgium;2. Department of Physics, Norwegian University of Science and Technology (NTNU), 7491, Trondheim, Norway;3. Paul Scherrer Institut, 5232, Villigen PSI, Switzerland;4. Department of Micro and Nanosystem Technology (IMST), University College of Southeast Norway, 3184, Borre, Norway;1. Institute of Microelectronics, School of Physical Science and Technology, Lanzhou University, 222 South Tianshui Road, Lanzhou 730000, China;2. College of Optical and Electronic Technology, China Jiliang University, 258 Xueyuan Street, Hangzhou 310018, China;3. Institute of Sensor Technology, Gansu Academy of Sciences, 229 South Dingxi Road, Lanzhou 730000, China |
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| Abstract: | Accurate measurements of the valence electronic structures of organic semiconductors are important for the development and understanding of organic electronic devices, materials, and interfaces. Ultraviolet photoelectron spectroscopy (UPS) is a well-established technique for probing valence electronic structures; however, many organic semiconductors undergo rapid sample degradation upon exposure to traditional laboratory-based vacuum ultraviolet (VUV) photon sources. Here, we report on a novel VUV photon source for UPS measurements that utilizes H Lyman-α emission with a narrow linewidth and a widely tunable intensity, and apply it to a number of organic materials of interest to show its ability to overcome this hurdle of sample degradation. Furthermore, the H Lyman-α source displays no measureable higher energy emission lines, which significantly reduces the background over typical He I discharge sources and allows for the onset of the density of states to be clearly observed over several orders of magnitude. |
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| Keywords: | Ultraviolet photoelectron spectroscopy Organic semiconductor Electronic structure NPD P3HT |
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