Triplet-induced degradation: An important consideration in the design of solution-processed hole injection materials for organic light-emitting devices |
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| Affiliation: | 1. Department of Electrical and Computer Engineering & Waterloo Institute for Nanotechnology, University of Waterloo, 200 University Avenue West, Waterloo, Ontario N2L 3G1, Canada;2. Solvay OLED, 2180 William Pitt Way, Pittsburgh, PA 15238, USA;1. Department of Physics and Astronomy and Optical Science and Technology Center, University of Iowa, Iowa City, IA, 52242, USA;2. Department of Physics and Astronomy, University of Wisconsin Eau Claire, Eau Claire, WI, 54702, USA;1. Center for Organic Photonics and Electronics Research (OPERA), Kyushu University, 744 Motooka, Nishi, Fukuoka 819-0395, Japan;2. Center for Future Chemistry, Kyushu University, 744 Motooka, Nishi, Fukuoka 819-0395, Japan;1. Institute of Lighting and Energy Photonics, National Chiao-Tung University, Tainan 71150, Taiwan;2. Institute of Photonic System, National Chiao-Tung University, Tainan 71150, Taiwan;3. Department of Biomedical Engineering, Hungkuang University, Taichung City, 43302, Taiwan;4. Department of Chemistry, National Taiwan University, Taipei 10617, Taiwan;1. Department of Chemistry, Queen''s University, Kingston, Ontario, Canada;2. Department of Physics, Engineering Physics and Astronomy, Queen''s University, Kingston, Ontario, Canada;3. Department of Chemistry and Chemical Engineering, Royal Military College, Kingston, Ontario, Canada |
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| Abstract: | Solution-processed organic light-emitting devices (OLEDs) still require improvements in their operational lifetime in order for them to become commercially viable. One factor that limits the lifetime of these devices is the instability of the hole injection layer (HIL). Therefore, understanding its degradation mechanism is crucial for the development of more stable solution-processed OLEDs. In this work, we use an archetypal fluorescent OLED in conjunction with an experimental solution-processed HIL in order to elucidate the degradation mechanism in these HILs. Our studies show that degradation is caused by triplet excitons. This new triplet-induced hole injection degradation is expected to be a common phenomenon in OLEDs, and therefore should have important implications for the design of stable HILs. |
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| Keywords: | Triplet excitons OLED Degradation mechanism Solution-processed Hole injection layer |
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