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Structural Morphological and Optical Properties of SnSb2S4 Thin Films Grown by Vacuum Evaporation Method |
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| Authors: | N Khedmi ;M Ben Rabeh ;M Kanzari |
| Affiliation: | [1]Labomtoire de Photovoltaiques et Materiaux de Semi-conducteurs-ENIT-Universite de Tunis el Manar, BP 37, le belvedere, 1002 Tunis, Tunisie; [2]Laboratoire de Photovoltaiques et Materiaux de Semi-conducteurs-ENIT-IPEITunis Montfleury-Universite de Tunis, Tunisie |
| Abstract: | Ternary system Thermal evaporation technique Thin films Thickness Atomic force microscopy （AFM） |
| Keywords: | Ternary system Thermal evaporation technique Thin films Thickness Atomic force microscopy （AFM） |
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