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PCB热变形的实时干涉测量研究
引用本文:王卫宁,耿照新,岳伟伟. PCB热变形的实时干涉测量研究[J]. 电子与封装, 2004, 4(6): 44-48
作者姓名:王卫宁  耿照新  岳伟伟
作者单位:首都师范大学物理系,北京,100037;首都师范大学物理系,北京,100037;首都师范大学物理系,北京,100037
摘    要:采用二次曝光和实时全息干涉技术对某一PCB进行了实验测试,获得了不同功率和不同夹持条件下PCB表面的离面位移分布以及离面位移随时间的动态变化图象。对两种不同的条纹图像进行处理,结果表明,随功率的增大,器件的离面翘曲量增大;在不同夹持条件下,由于器件局部受力约束和热传导条件的差异,呈现不同的位移分布,电阻区(热源区)附近的离面翘曲量变化较快而且较大。

关 键 词:PCB  可靠性  全息干涉
文章编号:1681-1070(2004)06-44-05
修稿时间:2003-03-06

Real-time Holographic Interferometry in Thermal Deformation of PCB
Wang Wei-ning,Geng Zhao-xin,Yue Wei-wei. Real-time Holographic Interferometry in Thermal Deformation of PCB[J]. Electronics & Packaging, 2004, 4(6): 44-48
Authors:Wang Wei-ning  Geng Zhao-xin  Yue Wei-wei
Abstract:In this paper, double exposure holograms and real-time holographic.Interferometry are applied to test a aviation apparatus.The results show that the out-of-plane displacement distributing and the full-motion video-images of the out-of-plane displacement under different power and fixing conditions, through deposing the two different pattern stripe, The results show that the out-of-plane displacement of PCB increase with the power increasing and the out-of-plane displacement distributing is different under the different fixing conditions and the conduction and restriction, the out-of-plane displacement in district of resistance vary quickly and largely.
Keywords:PCB Reliability Holographic Interferometry
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