| 光学元件吸收测量 |
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| 引用本文： | 魏红振,李家镕. 光学元件吸收测量[J]. 激光技术, 1999, 23(5): 284-287 |
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| 作者姓名： | 魏红振 李家镕 |
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| 作者单位： | 1.华中理工大学激光技术国家重点实验室, 武汉 430074 |
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| 摘 要： | 采用量热法测量了光学元件的吸收,分析了元件表面反射对测量的影响,并测量了GaAs基片和GaAs高反镜的吸收,分析了测量误差。
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| 关 键 词： | 量热法 光学薄膜 吸收测量 |
| 收稿时间： | 1998-06-15 |
| 修稿时间： | 1998-09-15 |
Measurement of optical component absorption |
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| Wei Hongzhen,Li Jiarong. Measurement of optical component absorption[J]. Laser Technology, 1999, 23(5): 284-287 |
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| Authors: | Wei Hongzhen Li Jiarong |
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| Abstract: | For design of a high energy laser system,it is important to measure the absorption properties of optical components.This pa per presented calorimetry to measure the optical absorption and discussed th e influence of the environmental factors and the interface reflection.As an exam ple,the absorption of GaAs substrate and GaAs high reflective mirror were measured.F inally, the measurement error was analyzed. |
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| Keywords: | calorimeter optical thin film ab sorption measurement |
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