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Parenchyma cell microstructure and textural characteristics of raw and cooked potatoes
Authors:Achinta Bordoloi  Lovedeep KaurJaspreet Singh
Affiliation:Riddet Institute, Massey University, Private Bag 11 222, Palmerston North 4442, New Zealand
Abstract:Cooking, microstructural and textural characteristics from four New Zealand potato cultivars (Agria, Nadine, Moonlight, and Red Rascal) were studied. Potatoes from the waxy cultivar, Nadine, showed lowest dry matter and starch content and also had highest cooking time compared to the other cultivars. The total colour difference, ΔE, indicative of browning and darkening during storage (for 1 h) of the peeled potatoes was observed to be highest for Red Rascal, followed by Nadine and was lowest for Agria. Light (LM) and confocal scanning electron (CSLM) micrographs revealed Moonlight and Red Rascal raw potato parenchyma cellular structure to be well integrated, showing compact hexagonal cells. Raw tubers from these cultivars also exhibited higher hardness and cohesiveness, as observed using texture profile analysis (TPA). Moonlight potato parenchyma retained cell wall outline after cooking and its cells were observed to be completely filled with gelatinised starch matrix, whereas the cellular structure of Nadine potato parenchyma was completely disintegrated after cooking. TPA results of cooked potatoes agreed well with these microstructural observations, with Moonlight cooked potatoes showing highest cohesiveness and hardness. The cell wall of parenchyma cells was observed to degrade partially upon cooking of potatoes, resulting in loosening of the cell wall microfibrils, as observed using transmission electron microscopy (TEM) of a selected potato cultivar. Also, the cell wall decreased in thickness after cooking. The remains of the primary cell wall along with some electron dense granular structures were observed floating in the cytoplasmic starchy matrix in potato tuber parenchyma cells.
Keywords:Potato  Solanum tuberosum  Parenchyma  Cell wall  Microstructure  Texture profile analysis
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