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Optimal intensity-modulation projection technique for three-dimensional shape measurement
Authors:Lu Cunwei  Xiang Limin
Affiliation:Department of Electronics and Information, Fukuoka Institute of Technology, 3-30-1 Wajirohigashi, Higashi-Ku, Fukuoka 8110295, Japan. lu@fit.ac.jp
Abstract:A new pattern projection technique for measuring three-dimensional topography is presented, called the optimal intensity-modulation projection technique. The proposed technique dramatically shortens the measurement time and improves stripe detection accuracy compared with previous methods. Furthermore, the method deals reliably with discontinuous patterns and multiple objects.
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