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塑封IC常见失效及对策
引用本文:李双龙.塑封IC常见失效及对策[J].电子与封装,2004,4(2):31-33,40.
作者姓名:李双龙
作者单位:天水华天微电子有限公司,甘肃,天水,741000
摘    要:本文探讨了塑封IC常见失效分析步骤、失效分析手段以及提高可靠性采取的措施:

关 键 词:失效  失效分析  可靠性

Plastic packaging IC common failure and prevent action
Li Shuanglong Tianshui Huatian Micro-Electronics Co.,Ltd,Tianshui,Gansu.Plastic packaging IC common failure and prevent action[J].Electronics & Packaging,2004,4(2):31-33,40.
Authors:Li Shuanglong Tianshui Huatian Micro-Electronics Co  Ltd  Tianshui  Gansu
Affiliation:Li Shuanglong Tianshui Huatian Micro-Electronics Co.,Ltd,Tianshui,Gansu,741000
Abstract:Ths article studies plastic packaging IC common failure and failure analysis procedure. failureanalysis method and the prevent actions to improve the reliability.
Keywords:Failure  Failure analysis  Reliability
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