Survivability-oriented optimal node density for randomly deployed wireless sensor networks |
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| Authors: | Wei Huangfu ZhongShan Zhang XiaoMeng Chai KePing Long |
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| Affiliation: | 1. Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices School of Microelectronics, Xidian University, Xi’an, 710071, China
2. Key Laboratory of Microelectronic Devices and Circuits, Institute of Microelectronics, Peking University, Beijing, 100871, China
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| Abstract: | Due to latch-up issue, the main problem of silicon-controlled rectifier (SCR) for power supply clamps in on-chip ESD protection is its inherent low holding voltage, especially in high-voltage applications. In this paper, we proposed a MOS-inside SCR (MISCR) showing nearly no snapback character and good ESD robustness, which is qualified for on-chip power clamp ESD protection. The stacked device achieves a series of triggering and holding voltage by altering the stacking number, which can also be used for the high voltage ESD power supply clamp applications. |
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| Keywords: | wireless sensor network survivability random deployment node density random failure |
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