Compositional dependence on the optical properties of amorphous As2 − xS3 − xSbx thin films |
| |
Authors: | Ramakanta Naik |
| |
Affiliation: | Department of Physics, Indian Institute of Science, Bangalore, 560012, India |
| |
Abstract: | In this paper, we report results of the optical properties of thermally deposited As2 − xS3 − xSbx thin films with x = 0.02, 0.07, 0.1 and 0.15. We have characterized the deposited films by Fourier Transform Infrared, Raman and X-ray photoelectron spectroscopy (XPS). The relationship between the structural and optical properties and the compositional variation were investigated. It was found that the optical bandgap decreases with increase in Sb content. The XPS core level spectra show a decrease in As2S3 percentage with increase in Sb content. This is confirmed from the shifting of the Raman peak from AsS3 vibrational mode towards SbS3 vibrational mode. |
| |
Keywords: | Chalcogenides Optical properties X-ray photoelectron spectroscopy X-ray diffraction Raman spectroscopy Amorphous |
本文献已被 ScienceDirect 等数据库收录! |
|