Impedance spectroscopy and relaxation phenomena of (Na,K) excess Na0.5K0.5NbO3 thin films grown by chemical solution deposition |
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| Authors: | Sun Young Lee Chang Won Ahn Ill Won Kim |
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| Affiliation: | a Department of Physics, University of Ulsan, Ulsan 680-749, South Koreab Convergence Components R&D Division, KETI, Seongnam 463-816, South Korea |
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| Abstract: | Na0.5K0.5NbO3 (NKN) and 10 mol% (Na,K) excess Na0.5K0.5NbO3 (NKN10) thin films on Pt/Ti/SiO2/Si substrate were prepared by chemical solution deposition. Crystallization of NKN10 thin films was confirmed by X-ray diffraction. The (Na,K) excess Na0.5K0.5NbO3 thin film shows a ferroelectric P-E hysteresis loop. Dielectric properties and impedance spectroscopy of thin films were investigated in the frequency range from 0.1 Hz to 100 kHz and the temperature range of 25 ~ 500 °C. By analyzing the complex impedance relaxation with Cole-Cole plots, we found impedance relaxations for the thin film. The contribution of electrical conduction is discussed in relation to grain, grain boundary, and interface effects. |
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| Keywords: | Na0 5K0 5NbO3 Thin films Chemical solution deposition Ferroelectric property Impedance spectroscopy |
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